Auflistung nach Schlagwort "signal dedicated verification (SiDeV)"

Auflistung nach Schlagwort "signal dedicated verification (SiDeV)"

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  • Briest, Niklas; Hamann, David; Garbe, Heyno; Potthast, Stefan (Piscataway, NJ : Institute of Electrical and Electronics Engineers Inc., 2017)
    Transverse electromagnetic (TEM) waveguides are predominantly used for emission and immunity tests. General requirements for TEM waveguides are given by the IEC 61000-4-20. Annex C of the IEC 61000-4-20 specifies immunity ...